User Contributed MET/CAL PROCEDURE ============================================================================= INSTRUMENT: Sub PM2528 Part3 DATE: 03-Oct-93 AUTHOR: User Contributed REVISION: 1.0 ADJUSTMENT THRESHOLD: 70% NUMBER OF TESTS: 31 NUMBER OF LINES: 212 CONFIGURATION: Fluke 5700A ============================================================================= STEP FSC RANGE NOMINAL TOLERANCE MOD1 MOD2 3 4 CON 1.001 HEAD {DIRECT CURRENT TEST} 1.002 DISP Connect testleads to the GUARD, 0, and A terminals of 1.002 DISP the UUT, and connect them to the 5700A output. 1.002 DISP (use the V GUARD of the 5700A). 1.003 IEEE F05,R3 1.004 5700 20uA S 2W 1.005 IEEE [D4000]E1[D1000] 1.006 IEEE ?[I] 1.007 MEM* 1000000 1.008 MEME 1.009 MEMC 20 uA 0.02/ 0.1% 2.001 5700 -20uA S 2W 2.002 IEEE [D4000]E1[D1000] 2.003 IEEE ?[I] 2.004 MEM* 1000000 2.005 MEME 2.006 MEMC 20 uA 0.02/ 0.1% 3.001 IEEE R4 3.002 5700 200uA S 2W 3.003 IEEE [D4000]E1[D1000] 3.004 IEEE ?[I] 3.005 MEM* 1000000 3.006 MEME 3.007 MEMC 200 uA 0.02/ 0.1% 4.001 5700 -200uA S 2W 4.002 IEEE [D4000]E1[D1000] 4.003 IEEE ?[I] 4.004 MEM* 1000000 4.005 MEME 4.006 MEMC 200 uA 0.02/ 0.1% 5.001 IEEE R5 5.002 5700 2mA S 2W 5.003 IEEE [D4000]E1[D1000] 5.004 IEEE ?[I] 5.005 MEM* 1000 5.006 MEME 5.007 MEMC 2 mA 0.02/ 0.1% 6.001 5700 -2mA S 2W 6.002 IEEE [D4000]E1[D1000] 6.003 IEEE ?[I] 6.004 MEM* 1000 6.005 MEME 6.006 MEMC 2 mA 0.02/ 0.1% 7.001 IEEE R6 7.002 5700 20mA S 2W 7.003 IEEE [D4000]E1[D1000] 7.004 IEEE ?[I] 7.005 MEM* 1000 7.006 MEME 7.007 MEMC 20 mA 0.02/ 0.1% 8.001 5700 -20mA S 2W 8.002 IEEE [D4000]E1[D1000] 8.003 IEEE ?[I] 8.004 MEM* 1000 8.005 MEME 8.006 MEMC 20 mA 0.02/ 0.1% 9.001 IEEE R7 9.002 5700 200mA S 2W 9.003 IEEE [D4000]E1[D1000] 9.004 IEEE ?[I] 9.005 MEM* 1000 9.006 MEME 9.007 MEMC 200 mA 0.02/ 0.1% 10.001 5700 -200mA S 2W 10.002 IEEE [D4000]E1[D1000] 10.003 IEEE ?[I] 10.004 MEM* 1000 10.005 MEME 10.006 MEMC 200 mA 0.02/ 0.1% 11.001 DISP Interconnect GUARD and 0 on the UUT with a short wire. 11.002 IEEE R8 11.003 5700 1.9A S 2W 11.004 IEEE [D4000]E1[D1000] 11.005 IEEE ?[I] 11.006 MEME 11.007 MEMC 2 A 0.02/ 0.1% 12.001 5700 -1.9A S 2W 12.002 IEEE [D4000]E1[D1000] 12.003 IEEE ?[I] 12.004 MEME 12.005 MEMC 2 A 0.02/ 0.1% 13.001 5700 * S 13.002 DISP Remove the interconnection between GUARD and 0 on the 13.002 DISP UUT and connect it to the A bus. 13.003 HEAD {ALTERNATING CURRENT TEST} 13.004 IEEE F06,R3 13.005 5700 20uA 50H S 2W 13.006 IEEE [D4000]E1[D1000] 13.007 IEEE ?[I] 13.008 MEM* 1000000 13.009 MEME 13.010 MEMC 20 uA 0.07/ 0.2% 50H 14.001 5700 20uA 1kH S 2W 14.002 IEEE [D4000]E1[D1000] 14.003 IEEE ?[I] 14.004 MEM* 1000000 14.005 MEME 14.006 MEMC 20 uA 0.07/ 0.2% 1KH 15.001 5700 20uA 1kH S 2W 15.002 IEEE [D4000]E1[D1000] 15.003 IEEE ?[I] 15.004 MEM* 1000000 15.005 MEME 15.006 MEMC 20 uA 0.07/ 0.4% 5KH 16.001 IEEE R4 16.002 5700 200uA 50H S 2W 16.003 IEEE [D4000]E1[D1000] 16.004 IEEE ?[I] 16.005 MEM* 1000000 16.006 MEME 16.007 MEMC 200 uA 0.07/ 0.2% 50H 17.001 5700 200uA 1kH S 2W 17.002 IEEE [D4000]E1[D1000] 17.003 IEEE ?[I] 17.004 MEM* 1000000 17.005 MEME 17.006 MEMC 200 uA 0.07/ 0.2% 1KH 18.001 5700 200uA 5kH S 2W 18.002 IEEE [D4000]E1[D1000] 18.003 IEEE ?[I] 18.004 MEM* 1000000 18.005 MEME 18.006 MEMC 200 uA 0.07/ 0.4% 5KH 19.001 IEEE R5 19.002 5700 2mA 50H S 2W 19.003 IEEE [D4000]E1[D1000] 19.004 IEEE ?[I] 19.005 MEM* 1000 19.006 MEME 19.007 MEMC 2 mA 0.07/ 0.2% 50H 20.001 5700 2mA 1kH S 2W 20.002 IEEE [D4000]E1[D1000] 20.003 IEEE ?[I] 20.004 MEM* 1000 20.005 MEME 20.006 MEMC 2 mA 0.07/ 0.2% 1KH 21.001 5700 2mA 5kH S 2W 21.002 IEEE [D4000]E1[D1000] 21.003 IEEE ?[I] 21.004 MEM* 1000 21.005 MEME 21.006 MEMC 2 mA 0.07/ 0.4% 5KH 22.001 DISP Interconnect GUARD and 0 on the UUT with a short wire. 22.002 IEEE R6 22.003 5700 20mA 50H S 2W 22.004 IEEE [D4000]E1[D1000] 22.005 IEEE ?[I] 22.006 MEM* 1000 22.007 MEME 22.008 MEMC 20 mA 0.07/ 0.2% 50H 23.001 5700 20mA 1kH S 2W 23.002 IEEE [D4000]E1[D1000] 23.003 IEEE ?[I] 23.004 MEM* 1000 23.005 MEME 23.006 MEMC 20 mA 0.07/ 0.2% 1KH 24.001 5700 20mA 5kH S 2W 24.002 IEEE [D4000]E1[D1000] 24.003 IEEE ?[I] 24.004 MEM* 1000 24.005 MEME 24.006 MEMC 20 mA 0.07/ 0.4% 5KH 25.001 IEEE R7 25.002 5700 200mA 50H S 2W 25.003 IEEE [D4000]E1[D1000] 25.004 IEEE ?[I] 25.005 MEM* 1000 25.006 MEME 25.007 MEMC 200 mA 0.07/ 0.2% 50H 26.001 5700 200mA 1kH S 2W 26.002 IEEE [D4000]E1[D1000] 26.003 IEEE ?[I] 26.004 MEM* 1000 26.005 MEME 26.006 MEMC 200 mA 0.07/ 0.2% 1KH 27.001 5700 200mA 5kH S 2W 27.002 IEEE [D4000]E1[D1000] 27.003 IEEE ?[I] 27.004 MEM* 1000 27.005 MEME 27.006 MEMC 200 mA 0.07/ 0.4% 5KH 28.001 IEEE R8 28.002 5700 1.9A 50H S 2W 28.003 IEEE [D4000]E1[D1000] 28.004 IEEE ?[I] 28.005 MEME 28.006 MEMC 2 A 0.07/ 0.2% 50H 29.001 5700 1.9A 1kH S 2W 29.002 IEEE [D4000]E1[D1000] 29.003 IEEE ?[I] 29.004 MEME 29.005 MEMC 2 A 0.07/ 0.2% 1KH 30.001 5700 1.9A 5kH S 2W 30.002 IEEE [D4000]E1[D1000] 30.003 IEEE ?[I] 30.004 MEME 30.005 MEMC 2 A 0.07/ 0.4% 5KH 31.001 5700 * S 31.002 DISP Remove the interconnection between GUARD and 0. 31.003 END